Optimal test plan of Step-stress model of alpha power weibull lifetimes under progressively type-II censored samples

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dc.contributor.authorAlotaibi, Refah
dc.contributor.authorAlmetwally, Ehab M.
dc.contributor.authorKumar, Devendra
dc.contributor.authorRezk, Hoda
dc.date.accessioned2023-05-05T14:26:41Z
dc.date.available2023-05-05T14:26:41Z
dc.date.issued2022
dc.description.abstractIn this study, the estimation of the unknown parameters of an alpha power Weibull (APW) distribution using the concept of an optimal strategy for the step-stress accelerated life testing (SSALT) is investigated from both classical and Bayesian viewpoints. We used progressive type-II censoring and accelerated life testing to reduce testing time and costs, and we used a cumulative exposure model to examine the impact of various stress levels. A log-linear relation between the scale parameter of the APW distribution and the stress model has been proposed. Maximum likelihood estimators for model parameters, as well as approximation and bootstrap confidence intervals (CIs), were calculated. Bayesian estimation of the parameter model was obtained under symmetric and asymmetric loss functions. An optimal test plan was created under typical operating conditions by minimizing the asymptotic variance (AV) of the percentile life. The simulation study is discussed to demonstrate the model’s optimality. In addition, real-world data are evaluated to demonstrate the model’s versatility.en_US
dc.identifier.urihttp://hdl.handle.net/123456789/1158
dc.language.isoenen_US
dc.publisherSymmetryen_US
dc.subjectaccelerated life testing; step-stress loading; progressively type-II censored samples; alpha power Weibull distribution; interval estimation; optimal designen_US
dc.titleOptimal test plan of Step-stress model of alpha power weibull lifetimes under progressively type-II censored samplesen_US
dc.typeArticleen_US
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